TS-23D Horizontal Spectrophotometer
TS-23D Horizontal Spectrophotometer | Fixed 8 mm, SCI/SCE
TS-23D horizontal spectrophotometer uses D/8 geometry, a dual optical path and a combined full-spectrum LED source for visible-range color measurement. It supports SCI/SCE and a fixed Φ8 mm measuring aperture for general flat samples with adequate measurement area. This configuration is suited to repeatable color comparison under consistent laboratory or production QC conditions.
Applications include plastics and electronics, paints and inks, textiles and dyeing, printing, ceramics and packaging, as well as R&D and quality control. The instrument supports spectral data, L*a*b* and ΔE evaluation, supplier acceptance, batch comparison and standard-color management. Before selection, confirm the sample material, surface condition, measurement area, gloss, required SCI/SCE mode and existing QC procedure.
Applications
Plastics, electronics and components
Compare color across plastic housings, molded parts, electronic components, coatings and incoming materials. Establish consistent sampling points and compare results with approved standards to support batch acceptance and process checks.
Paints, inks and coatings
Evaluate paint and ink formulas, coating batches and matches to standard colors. When gloss or surface finish varies, define whether SCI, SCE or both are required so measurements follow the same acceptance method.
Textiles, dyeing and printing
Compare fabrics, dyed materials, printed products and packaging materials. Select representative points and apply QC limits suited to the texture, pattern and uniformity of each sample.
General flat samples
The fixed Φ8 mm aperture is intended for samples that provide sufficient flat measurement area. Confirm the sample can cover the aperture and that the chosen points represent the batch.
Key features
Fixed Φ8 mm aperture
The fixed Φ8 mm measuring aperture supports repeatable readings when the sample has enough area and can be positioned consistently. It is not an interchangeable aperture; consider another model for very small or complex measurement points.
D/8 and SCI/SCE
D/8 geometry supports diffuse illumination with 8-degree viewing, while SCI/SCE measurement helps compare color with or without the influence of surface gloss. Apply the mode specified by your standard and keep it consistent across comparisons.
Dual optical path
The dual optical path is designed for color measurement and data communication. Evaluate stability with your own materials, calibration routine and acceptance tolerances before applying results to production decisions.
Traceable QC data
Spectral and color-difference results can support R&D, incoming inspection, process sampling, batch comparison and supplier management when measurement conditions, standards and acceptance limits are controlled.
Feature details
High-performance array sensor
The silicon photodiode array uses two rows of 40 elements to collect spectral information. This supports color-value and batch comparisons; actual repeatability depends on the sample, positioning, instrument warm-up and calibration procedure.
Full-spectrum LED source
The combined full-spectrum LED source supports visible-range color measurement, standard-color comparison and batch tracking. Confirm the supplied instrument configuration and measurement settings for the intended workflow.
Instrument agreement and repeatability
Repeatability and agreement are important when comparing instruments or monitoring production over time. The published limits depend on specified test conditions, calibration and reference tiles; verify performance using the method used at your site.
Colorimetric indices
Depending on the supplied software and version, available functions may include whiteness and yellowness indices, metamerism, color-difference graphs, pass/fail evaluation, color simulation and color-bias analysis. Confirm which functions are included in the delivered configuration.
Camera view for positioning
The display camera view and positioning plate help the operator locate and confirm measurement points on color patches, patterned materials and printed areas before taking a reading.
Compact horizontal design
The horizontal layout is intended for laboratory work and production sampling. Check sample support and positioning requirements in advance, especially for small, curved, flexible or uneven materials.
Dual path and algorithms
The dual optical path and measurement algorithms are intended to support stable readings across materials such as plastics, coatings, textiles, printed products, ceramics and packaging. Confirm performance with representative samples and the required calibration conditions.
Multiple color spaces
Supported color spaces include CIE LAB, XYZ, Yxy, LCh, CIE LUV, s-RGB, HunterLab, βxy, DIN Lab99 and Munsell (C/2). Confirm software support and export format when integrating color data into existing records.
Fixed Φ8 mm aperture
TS-23D has a fixed Φ8 mm measuring aperture and requires adequate sample area. For smaller, patterned, curved or more complex points, compare TS-25D or TS-26D and confirm the aperture options against the actual sample.
3.5-inch color touchscreen
The 3.5-inch full-color capacitive touchscreen displays sample color values and difference results for on-site review. Confirm the required data, report format and pass/fail criteria in the selected workflow.
Single and average measurement
A single reading is suitable for a quick check on a uniform sample. For textured or uneven color, an average of multiple readings may better represent the sample; use the number and placement of readings defined by your QC procedure.
SQCX quality management software
SQCX functions depend on the supplied software version and configuration. Confirm whether color-data management, sample-to-standard comparisons, reports and internal-standard workflows are included before purchase.
Compare TS-23D, TS-25D and TS-26D
For three apertures, flexible points or small areas, evaluate TS-26D. To choose Φ8 or Φ4 mm before purchase, compare TS-25D. For fixed Φ8 mm and adequate area, consider TS-23D. Compare the aperture options, sample size, surface condition and QC goals before selection. Specifications and available functions can vary by supplied version; confirm the configuration with the manufacturer or Fulcrum Technology.
Related models
For other workflows, compare high-end handheld, 3nh handheld, benchtop or colorimeter options.
Frequently asked questions
Q1: What samples suit TS-23D?
TS-23D suits general flat samples that provide adequate area for its fixed Φ8 mm aperture, including plastics, electronics, coatings, inks, textiles, printed products, ceramics and packaging. For small, curved, textured or uneven samples, share the dimensions and surface details to confirm suitability.
Q2: How does it differ from TS-25D?
TS-23D uses a fixed Φ8 mm aperture. TS-25D allows an Φ8 mm or Φ4 mm aperture to be selected before purchase; confirm which configuration is appropriate for your smallest measurement area.
Q3: How to choose TS-23D or TS-26D?
Choose TS-23D when a fixed Φ8 mm aperture fits the sample. Consider TS-26D when you need a choice of Φ8 mm, Φ4 mm or 1 × 3 mm apertures for smaller or more complex measurement points.
Q4: What is SCI/SCE for?
SCI and SCE help assess the effect of gloss on measured color. Select the mode required by your internal or customer standard, and use the same mode for standards, samples and subsequent comparisons.
Q5: Single or average readings?
Use a single reading for a uniform sample when permitted by your procedure. For texture or uneven color, take an average using defined measurement points and follow the applicable QC rules.
Q6: What should I provide for a quote?
Provide the material, sample dimensions and flat measurement area, surface and gloss/fluorescence characteristics, color formula, acceptance limits, SCI/SCE requirements and reporting needs. These details help confirm aperture suitability and the correct measurement workflow.
Is TS-23D right for fixed 8 mm color QC?
Share the sample material, dimensions and available flat area, color formula, SCI/SCE conditions and acceptance criteria so the aperture and measurement workflow can be reviewed before selection.
Contact Fulcrum Technology
TS-23D Horizontal Spectrophotometer Specifications
| Model | TS-23D |
| Optical geometry | D/8 (diffuse illumination, 8° viewing); SCI/SCE; UV excluded; conforms to CIE No.15, GB/T 3978, GB 2893, GB/T 18833, ISO 7724-1, ASTM E1164 and DIN 5033 Teil 7 |
| Feature | Φ8 mm aperture for laboratory color analysis and data communication; for color measurement and QC in plastics/electronics, paints/inks, textiles/dyeing, printing and ceramics |
| Integrating sphere | Φ40 mm |
| Illumination source | Combined full-spectrum LED |
| Spectral method | Flat grating |
| Sensor | Silicon photodiode array (dual rows, 40 elements each) |
| Wavelength range | 400–700 nm |
| Wavelength interval | 10 nm |
| Spectral bandwidth | 10 nm |
| Reflectance range | 0–200% |
| Measuring aperture | MAV: Φ8 mm / Φ10 mm |
| Measurement mode | SCI and SCE measured simultaneously |
| Color spaces | CIE LAB, XYZ, Yxy, LCh, CIE LUV, s-RGB, HunterLab, βxy, DIN Lab99, Munsell (C/2) |
| Color difference formulas | ΔE*ab, ΔE*uv, ΔE*94, ΔE*cmc (2:1), ΔE*cmc (1:1), ΔE*00, DIN ΔE99, ΔE (Hunter) |
| Other colorimetric indices | WI (ASTM E313, CIE/ISO, AATCC, Hunter), YI (ASTM D1925, ASTM E313), metamerism index Mt, staining and colorfastness, tint strength, opacity, 8° gloss, 555 hue classification, blackness (My, dM), CMYK color density, metamerism index Milm and Munsell (some functions via PC software) |
| Observer angle | 2° / 10° |
| Illuminants | D65, A, C, D50, D55, D75, F1, F2 (CWF), F3, F4, F5, F6, F7 (DLF), F8, F9, F10 (TPL5), F11 (TL84), F12 (TL83 / U30) |
| Display | Spectral graph/data, sample color values, color differences/graphs, pass/fail, color simulation and color bias |
| Measurement time | Approx. 1.5 s; approx. 3.2 s for simultaneous SCI/SCE |
| Repeatability | Color value: MAV/SCI, ΔE*ab ≤0.04 (average of 30 white-tile readings at 5-second intervals after warm-up and calibration); spectral reflectance: MAV/SCI standard deviation ≤0.08% (≤0.18% over 400–700 nm) |
| Instrument agreement | MAV/SCI, ΔE*ab ≤0.2 (average of 12 BCRA Series II color tiles) |
| Measurement mode | Single or average (2–99 readings) |
| Positioning | Display camera view and positioning plate |
| Dimensions | L × W × H = 129 × 76 × 217 mm |
| Weight | Approx. 600 g |
| Battery | Li-ion, 3.7 V, 5000 mAh; up to 6,000 measurements within 8 hours |
| Light source life | Over 3 million measurements over 5 years |
| Display screen | 3.5-inch TFT full-color capacitive touchscreen |
| Interface | USB |
| Data storage | 1,000 standards; 10,000 samples (one record can include both SCI/SCE) |
| Languages | Traditional Chinese, Simplified Chinese, English and Russian |
| Operating conditions | 0–40°C, 0–85% RH (non-condensing), altitude below 2,000 m |
| Storage conditions | −20–50°C, 0–85% RH (non-condensing) |
| Standard accessories | Power adapter, data cable, manual, quality management software (download from official site), black/white calibration box, protective cover, Ø8 mm platform aperture and Ø8 mm pointed aperture |
| Optional accessories | Mini printer and powder test box |
Specification note: TS-23D has a fixed Φ8 mm measuring aperture and suits general samples with a larger measurement area. For small areas, texture, gloss variation, curved surfaces or special materials, share sample information to confirm whether the aperture and conditions fit your QC workflow. Specifications are compiled from current product information; confirm the supplied version with the manufacturer or Fulcrum Technology.
Related Products
The TS-26D benchtop spectrophotometer uses D/8 geometry with SCI/SCE measurement and a combined full-spectrum LED and UV light source. Choose among three apertures—MAV Φ8/Φ10 mm, SAV Φ4/Φ5 mm, or SSAV 1 × 3 mm—to suit the sample and measurement area. It supports spectral reflectance, L*a*b* values and ΔE color assessment for plastics, electronics, coatings, inks, textiles, printing, ceramics, packaging, R&D and quality control. Confirm aperture, UV settings and SCI/SCE conditions against your sample and inspection standards.
For configuration or measurement-method guidance, contact Fulcrum Technology.