AiT CMT-100MP handheld four-point probe meter for surface resistance testing of films, glass, conductive materials, and solar samples
AiT CMT-100MP handheld four-point probe meter for surface resistance testing of films, glass, conductive materials, and solar samples

CMT-100MP Handheld Four-Point Probe Surface Resistance Meter

The CMT-100MP is a handheld four-point probe instrument for rapid measurement of surface resistance, sheet resistance, or resistivity in films, glass, conductive materials, ITO/TCO, solar materials, wafer pieces, coated samples, and R&D materials. Compared with benchtop four-point probe systems, it is suited to quick on-site checks, preliminary sample screening, incoming inspection, and measurements on large samples or local areas that are difficult to place on a platform. Confirm suitability against sample dimensions and surface condition, resistance range, probe contact conditions, and inspection objectives.

CMT-100MP Handheld Four-Point Probe Sheet Resistance Measurement Applications

The CMT-100MP measures surface resistance, sheet resistance, or resistivity in chips, films, solar cells, conductive films, ITO/TCO, and R&D samples. It is suitable for quick on-site checks, incoming inspection, small-sample testing, and local-area measurements. Confirm suitability based on sample size and surface condition, resistance range, probe contact conditions, and test objectives.

01

Measurement of Chips, Films, and Solar Cells

Measure surface and sheet resistance in thin-layer materials such as chips, films, and solar cells for R&D testing, process verification, and quick on-site checks.

02

Multiple Measurement Units

Display measurement results in ohm, ohm/sq, ohm·cm, and S to accommodate different materials and testing needs.

03

Single-Point Center Measurement with Manual Lever

Lower the manual lever to contact the sample center at one point. Its intuitive operation suits quick on-site checks and small-batch sample inspection.

04

JANDEL Probe Configuration

The JANDEL probe is a key component for contact-based four-point probe surface-resistance measurement. Confirm actual suitability based on sample surface, contact stability, and measurement workflow.

Selection note: The CMT-100MP suits handheld or semi-manual center-point measurement. For a fixed stage, automatic downforce, multi-point Mapping, 2D/3D analysis, or large samples, evaluate other AiT four-point probe systems according to sample size and data-analysis needs.


CMT-100MP Handheld Four-Point Probe Surface Resistance Measurement Specifications

The CMT-100MP is designed for handheld, manual center-point measurement of sheet or surface resistance and resistivity. Confirm suitability based on sample size and surface condition, resistance range, probe contact conditions, and inspection objectives.

SpecificationCMT-100MP
Measurement range1 mΩ/sq–2 MΩ/sq
OperationLower the manual lever to bring the four-point probe into contact with one point at the center of the sample, then take the reading. This is a manual single-point measurement configuration, not an automatic multi-point stage.
JANDEL four-point probeSupplied with a JANDEL probe and quick-fit connector/adapter. Ensure stable probe contact with the sample surface during measurement.
Displayed unitsResults can be displayed in ohm, ohm/sq, ohm·cm, and S, depending on the measurement configuration.
Measurement displayData is displayed directly on the instrument panel.
Measurement speedApprox. 2 ± 1 sec/point
Internal component accuracy±0.5% (high-precision resistor)
Maintenance and serviceElectronic components are mounted on replaceable printed circuit boards to support maintenance and service.

Specifications are for reference only. Actual results depend on sample dimensions and surface condition, probe contact, measurement environment, and quality-control procedures.

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