LS152 Coating Thickness Monitoring System | 45-Point Thin-Film Measurement
LS152 in-line coating thickness monitoring
Monitor thin-film coating thickness with transmittance and optical-density data
The LS152 coating thickness monitoring system is designed for vacuum-coating and continuous thin-film production lines. It measures optical transmittance (T%) and optical density (OD) to help track coating thickness and product uniformity for process quality control.
The system supports up to 45 measuring points, with probe layouts configured for the line and data displayed through an independent user interface. Measurement accuracy depends on the coating and substrate, probe position, calibration method, and site conditions; confirm application requirements before selection.
Transmittance and optical density
Monitor changes in optical transmittance and optical density to help assess thin-film coating thickness and uniformity.
Non-contact optical measurement
Read material signals optically for monitoring thin-film products on continuous production lines.
Multi-point monitoring
Support for up to 45 measuring points; plan probe positions according to web width, spacing, and quality-control needs.
Infrared with optional green light
The standard wavelength is 850 nm infrared, with optional 530 nm green light. Select the wavelength for the material.
Communications and line integration
Dual RS485 and standard MODBUS support allow monitoring and data transfer to be planned for the production line.
Independent user interface
View measurement data on the user interface. Computer monitoring and vacuum-flange options depend on the system configuration.
Transmittance and optical-density readings depend on the material and measurement conditions. Share the substrate, coating, line speed, measurement points, and available installation space to confirm calibration, probe layout, and functions. Contact our team to discuss your application.
| System | LS152 thickness monitor / in-line coating thickness monitor for vacuum coating lines |
|---|---|
| Test wavelength | 850 nm infrared; optional 530 nm green light |
| Measurement spot | 5 mm circular |
| Transmittance accuracy | Better than ±1% (colorless, uniform transparent materials) |
| Transmittance resolution | 0.005% |
| Optical density range | 0.00 OD–5.00 OD |
| Optical density resolution | 0.01 OD from 0.00–3.00 OD; 0.05 OD from 3.00–5.00 OD |
| Maximum measuring points | 45 |
| Minimum spacing between adjacent probes | 35 mm |
| Source-to-receiver probe spacing | 20 mm |
| Operating temperature | −10°C–60°C |
| Storage temperature | −20°C–70°C |
| Relative humidity | Below 85%, non-condensing |
| Data refresh cycle | Normal: 300 ms; fast: 100 ms |
| Communication interface | Dual RS485 |
| Protocol | Standard MODBUS supported |
| Dimensions | Length custom-made to customer requirements × width 80 mm × height 180 mm |
| Vacuum flange electrode cores required | 6 (without computer monitoring); 9 (with computer monitoring) |
| Power | 220 V, 0.2 A AC / 50 Hz |
| Note | LS152 is suitable for in-line monitoring of transmittance T% and optical density OD on vacuum-coating, roll-to-roll coating, glass-coating, window-film, and transparent-film lines. Specifications and custom configurations may change; confirm current information with the manufacturer or Fulcrum. Actual implementation must be validated for the material's optical properties, coating process, measuring points, equipment space, communication interface, and control logic. |
LS152 coating thickness monitoring system
Product overview and operation
See how the LS152 uses transmittance and optical-density data to monitor coating thickness and uniformity on thin-film products. Actual measurement performance depends on the material, probe position, and production-line conditions.
Measurement principle
Transmittance and optical-density monitoring
This demonstration shows how optical signals are read and used for in-line monitoring of thin-film coatings. Confirm the installation and calibration method for your material and operating conditions.
System application
Multi-point measurement and line integration
View an example of the LS152 multi-point configuration and production-line monitoring. Select the number of measuring points and probe layout according to line width and inspection needs.
On-site demonstration
In-line coating thickness monitoring with LS152
See the monitoring workflow and operating interface in a production setting. For help confirming material compatibility, probe configuration, or communications, contact our team.
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