Delcom Non-Contact Sheet Resistance Measurement Systems
Delcom Non-Contact Sheet Resistance Measurement Systems
Fulcrum Technology supplies US-made Delcom non-contact sheet resistance systems for electrical testing of conductive films, ITO/TCO, coated glass, wafers, and similar materials. Applications include R&D, incoming inspection, process quality control, and roll-to-roll monitoring.
Non-contact measurement reduces the risk of scratches from probe contact, making it suitable for surface-sensitive samples or samples whose conductive layer must be protected. Top-and-bottom and single-sided probe designs are available across benchtop, handheld/module, and inline systems for laboratories, field testing, and equipment integration.
Benchtop RD/RS Series Comparison
RD uses probes above and below the sample; RS uses a single-sided probe.
RD sensor gap and measurement area can be configured; the RS series requires a fixed distance between the sensor and conductive layer.
S3, 20J3, and 30C9 Handheld/Module Comparison
Optional platforms support benchtop testing, or the probe configuration can be planned for equipment integration. The following specifications are listed on the product pages.
Ø indicates the diameter of the circular measurement area; sensor spacing is not the maximum sample thickness. S3 accesses the conductive layer from one side; samples for 20J3 and 30C9 are placed between sensors on both sides. Other measurement areas, spacing, and ranges can be discussed for configuration.
How to Select a Sheet Resistance Range
Standard ranges include:
×10：5～100,000 Ω／□
×1：0.5～10,000 Ω／□
÷10：0.05～1,000 Ω／□
÷100：0.005～100 Ω／□。
Sensors are typically configured with two adjacent ranges; select them based on the sample’s estimated resistance. A single configuration does not cover all ranges listed above.
Roll-to-Roll and Continuous Process Monitoring
Inline Multi-Sensor Measurement System
Multiple sensors across the material width monitor sheet resistance and cross-web uniformity at different positions. Sensor count, position, and support length depend on the production line.
Movable Inline Measurement System
Sensor positions can move across the material width to suit different web widths and measurement points. Confirm the movement mechanism, material stability, and data acquisition method before integration.
Sheet Resistance, Resistivity, and Thickness Conversion
Sheet resistance is expressed in Ω/□; resistivity in Ω·cm. Estimating resistivity or film thickness from sheet resistance requires known thickness or material resistivity and a structure that meets the conversion conditions.
Multilayer conductive materials cannot be calculated as a single conductive layer.
Please provide these details before requesting a quotation
- Sample material, length, width, thickness, and the position and number of conductive layers.
- Estimated sheet resistance range, measurement-point size, and single-point or multi-point measurement needs.
- Whether you need benchtop testing, field inspection, or inline monitoring. For inline use, also provide web width, line speed, and installation space.
Fulcrum Technology can help assess sensors, platforms, interface modules, and software. For SiC, special coatings, multilayer conductive structures, or conductive layers beneath insulation, verify measurement performance with an actual sample first.
