Delcom Benchtop Non-contact Surface Resistance Measurement System
Delcom Benchtop Non-contact Surface Resistance Measurement System | RD/RS Series Selection
Zhidi Technology provides Delcom benchtop non-contact surface resistance measurement system, designed to measure surface resistance, surface conductivity, volume resistivity, and related thin-layer electrical properties of conductive films, ITO, TCO, wafers, coated glass, mirror-finish materials, thick materials, and curved materials. Select a suitable model based on RD/RS sensor configuration, 200/300/450 mm platform size, sample thickness, conductive-layer location, and estimated ohm/sq range.
Platform and sample considerations
Sample thickness and conductive-layer position
For films, wafers, coated glass, or sheets, first confirm whether the conductive layer is on the front, back, or within a layered structure. The RD series uses a C-shaped, top-and-bottom sensor, so the sample must fit between the sensors. The RS series uses a one-sided sensor and is more suitable for thicker samples or samples that cannot fit between opposing sensors.
Platform and sample considerations：200／300／450 mm
For smaller samples, consider the 200 mm platform first. For samples near 8-inch or 12-inch size, or larger sheets, assess the 300 mm or 450 mm platform based on sample dimensions, measurement area, and required support.
Material type and effective measurement depth
According to the available specifications, the RD series has an effective resistance measurement depth of approximately 0–6 mm and requires a sample thickness below 6 mm. The RS series uses a one-sided sensor, with an effective measurement depth of approximately 3 mm or less; sample body thickness is not limited to 3 mm. Confirm suitability based on material structure and conductive-layer position.
How to make an initial choice between the RD/RS benchtop series
200 mm platform | RD200/RS200
Suitable for smaller films, wafers, glass, sheets, and R&D samples. For routine benchtop quality control and incoming inspection, consider RD200 or RS200 .
Typical samples and inspection recommendations
Conductive films and ITO/TCO
Suitable for non-contact sheet-resistance testing of transparent conductive films, ITO, TCO, coated glass, and related thin-film materials in R&D, incoming inspection, and process comparison.
Wafers and semiconductor materials
Assess a benchtop configuration based on wafer size, material structure, conductive-layer location, and estimated resistance range. Confirm the final choice against the sample conditions.
Glass, mirror-finish, and thick materials
For coated glass, mirror-finish materials, thick substrates, or special structures, also confirm thickness, surface condition, conductive-layer location, and measurement distance.
R&D testing and incoming quality control
Suitable for building R&D material data, supplier incoming inspection, batch comparison, and pre-acceptance checks. For in-line monitoring, consider a separate Delcom in-line system.
Delcom benchtop non-contact surface resistance systems are suitable for fixed-location R&D testing, quality inspection, and incoming acceptance. Before selection, provide the sample size, thickness, material structure, conductive-layer location, estimated ohm/sq range, mapping needs, and measurement-speed or data-output requirements. For background on sheet resistance, ohm/sq, and resistivity, read What is surface resistance Rs (sheet resistance) and Relationship between resistivity and thickness. Final selection should be based on the sample, inspection purpose, and quality-control workflow.
Benchtop non-contact surface resistance measurement FAQs
What is the difference between the RD and RS series?
The RD series uses a C-shaped top-and-bottom sensor, and the sample must be placed between the sensors. Based on the available specifications, its effective resistance measurement depth is approximately 0–6 mm, and sample thickness must be below 6 mm.
The RS series uses a one-sided sensor, so the sample does not need to fit between opposing sensors as it does with the RD series. The available specifications indicate an effective measurement depth of approximately 3 mm or less, while sample body thickness is not limited to 3 mm. Confirm suitability based on sample thickness, conductive-layer location, material structure, and estimated ohm/sq range.
How should I choose a 200/300/450 mm platform?
Choose based on sample size, measurement area, and platform support. For smaller R&D and QC samples, start with 200 mm;larger wafers, glass, or sheets may call for a 300 mm or 450 mm platform.
What information should I provide before requesting a quotation?
Provide the sample material, dimensions, thickness, conductive-layer location, estimated surface-resistance range, mapping needs, data-output requirements, and inspection purpose or customer acceptance criteria.
Need help selecting an RD/RS benchtop non-contact surface resistance system?
Share the sample dimensions, thickness, material structure, conductive-layer location, and estimated ohm/sq range. Zhidi Technology can help assess RD200, RS200, RD300, RS300, RD450, and RS450 benchtop options.
Contact Zhidi Technology for selection advice
- Available in narrow gap for thin materials (wafers,TCOs, etc.) or large gap for thick/curved materials (glass, mirrors, etc.)
- Two sided sensor with 200 mm by 200 mm stage
- Noncontact measurement of sheet resistance, sheet conductance, resistivity, thickness, and emissivity
- Range options from .005 ohms/square to 100,000 ohms/square
- Detachable probe – add additional sensors, ranges, and stages any time
- Interface via simple one button operation, Delcom software, Python library, or MODBUS/TCP
- Single-sided sensor embedded in 200 mm x 200 mm stage – ideal for thick or curved materials
- Noncontact measurement of sheet resistance, sheet conductance, resistivity, thickness, and emissivity
- Range options from .005 ohms/square to 100,000 ohms/square
- Detachable probe – add additional sensors, ranges, and stages any time
- Interface via simple one button operation, Delcom software, Python library, or MODBUS/TCP
RD300 Sensor
- Available in narrow gap for thin materials (wafers,TCOs, etc.) or large gap for thick/curved materials (glass, mirrors, etc.)
- Two sided sensor with 300 mm by 300 mm stage
- Noncontact measurement of sheet resistance, sheet conductance, resistivity, thickness, and emissivity
- Range options from .005 ohms/square to 100,000 ohms/square
- Detachable probe – add additional sensors, ranges, and stages any time
- Interface via simple one button operation, Delcom software, Python library, or MODBUS/TCP
RS300 Sensor
- Single-sided sensor embedded in 300 mm x 300 mm stage – ideal for thick or curved materials
- Noncontact measurement of sheet resistance, sheet conductance, resistivity, thickness, and emissivity
- Range options from .005 ohms/square to 100,000 ohms/square
- Detachable probe – add additional sensors, ranges, and stages any time
- Interface via simple one button operation, Delcom software, Python library, or MODBUS/TCP
RD450 Sensor
- Available in narrow gap for thin materials (wafers,TCOs, etc.) or large gap for thick/curved materials (glass, mirrors, etc.)
- Two sided sensor with 450 mm by 450 mm stage
- Noncontact measurement of sheet resistance, sheet conductance, resistivity, thickness, and emissivity
- Range options from .005 ohms/square to 100,000 ohms/square
- Detachable probe – add additional sensors, ranges, and stages any time
- Interface via simple one button operation, Delcom software, Python library, or MODBUS/TCP
RS450 Sensor
- Single-sided sensor embedded in 450 mm x 450 mm stage – ideal for thick or curved materials
- Noncontact measurement of sheet resistance, sheet conductance, resistivity, thickness, and emissivity
- Range options from .005 ohms/square to 100,000 ohms/square
- Detachable probe – add additional sensors, ranges, and stages any time
- Interface via simple one button operation, Delcom software, Python library, or MODBUS/TCP