Four-point probe measurement of 156 × 156 mm solar cells with Jandel probe and mapping analysis
Four-point probe measurement of 156 × 156 mm solar cells with Jandel probe and mapping analysis

AiT CMT-SR2000N-PV Semi-Automatic Solar PV Four-Point Probe Measurement System

The AiT CMT-SR2000N-PV, supplied by Fulcrum Technology, is a semi-automatic four-point probe measurement system for Solar PV cells, including 156 × 156 mm samples. Combined with a high-stability Jandel probe from the UK, it supports sheet-resistance (Ω/□) and resistivity (Ω·cm) measurements for solar cells and related materials. Its versatile mapping software offers multiple graphical views and analysis tools to help assess measurement results, distribution, and uniformity across sample locations for process evaluation and quality management. Configuration can be reviewed according to sample size, measurement points, expected electrical ranges, analysis requirements, and the existing QC workflow. Confirm the applicable measurement range, point layout, probe configuration, and data-output requirements using the actual sample and inspection purpose.

 

Product Features

AiT CMT-SR2000N-PV is a semi-automatic four-point probe measurement system for solar PV cells, including 156 × 156 mm samples. It supports solar-material R&D, process monitoring, and quality management. Confirm the actual measurement conditions against the sample and inspection workflow.

01

For 156 × 156 mm Solar Cells

Designed for surface-resistance measurement of solar-cell samples to help assess process uniformity and electrical quality.

02

Multiple Measurement Units

Results can be displayed in ohm, ohm/sq, ohm·cm, and S units to support interpretation of material and process data.

03

Standalone or Computer-Controlled Operation

Choose standalone operation or computer-software control for measurement, data organization, and further analysis.

04

2D and 3D Analysis Views

Analysis software can present measurement data as 2D contour maps or 3D plots to help review resistance distribution and uniformity across sample locations.

05

JANDEL Probe Configuration

Equipped with a JANDEL probe for contact four-point-probe surface-resistance measurement. Confirm suitability based on the sample surface and measurement process.

Selection note: For 156 × 156 mm solar-cell surface-resistance measurement, sheet-resistance distribution, 2D/3D mapping, or process-uniformity evaluation, first confirm sample dimensions, expected resistance range, measurement points, data-output format, and internal quality requirements.


Measurement range

1 mΩ/sq~2 MΩ/sq

Operating method

The operator simply places the sample on the measurement stage and presses the measurement key. The range adjusts automatically and displays the correct reading, including the decimal point and multiplier.

JANDEL four-point probe

The probe uses a quick-connect fitting/converter designed by JANDEL. No special tools or alignment fixtures are required, and installation can be completed within minutes. The unit comes standard with a JANDEL probe.

Measurement data display

Measurement data is displayed directly on the equipment's control panel.

Measurement speed

Approx. 2±1 seconds/point

Internal component accuracy

±0.5% (high-precision resistor)

Maintenance and service

Advanced microprocessor technology enables trouble-free operation and high reliability. All electronic components are installed on easily replaceable printed circuit boards.

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