Benchtop & Inline Hybrid

S3 Hybrid
Delcom S3 Hybrid

S3 Benchtop or Inline Sensor

  • Single-sided sensor reads even the thickest nonconductive substrates
  • Noncontact measurement of sheet resistance, sheet conductance, resistivity, thickness, and emissivity
  • Range options from .005 ohms/square to 100,000 ohms/square
  • Hybrid instrument – use for benchtop, inspection station, or inline
  • Detachable probe – add additional sensors, ranges, and stages any time
  • Interface via simple one button operation, Delcom software, Python library, or MODBUS/TCP
20J3 Hybrid
Delcom 20J3 Hybrid

20J3 Benchtop or Inline Sensor

  • Ideal for thin conductive materials or coatings such as wafers, glass, TCOs, etc.
  • Noncontact measurement of sheet resistance, sheet conductance, resistivity, thickness, and emissivity
  • Range options from .005 ohms/square to 100,000 ohms/square
  • Hybrid instrument – use for benchtop, inspection station, or inline
  • Detachable probe – add additional sensors, ranges, and stages any time
  • Interface via simple one button operation, Delcom software, Python library, or MODBUS/TCP
30C9 Hybrid
30C9 Hybrid

30C9 Benchtop or Inline Sensor

  • Large 9 mm gap is ideal for thicker materials such as glass
  • Noncontact measurement of sheet resistance, sheet conductance, resistivity, thickness, and emissivity
  • Range options from .005 ohms/square to 100,000 ohms/square
  • Hybrid instrument – use for benchtop, inspection station, or inline
  • Detachable probe – add additional sensors, ranges, and stages any time
  • Interface via simple one button operation, Delcom software, Python library, or MODBUS/TCP
top