Semi-automatic 8-inch wafer sheet-resistance meter AiT CMT-SR2000N with JANDEL four-point probe
Semi-automatic 8-inch wafer sheet-resistance meter AiT CMT-SR2000N with JANDEL four-point probe

AiT CMT-SR2000N Semi-Automatic 8-Inch Wafer Four-Point Probe Measurement System (200 mm)

The AiT CMT-SR2000N semi-automatic 8-inch wafer measurement system pairs with a high-stability UK JANDEL probe to provide precise four-point measurements of sheet resistance (Ω/□) and volume resistivity (Ω·cm). Its versatile Mapping software analyzes resistance uniformity and calculates thickness from resistance data, supporting efficient measurement and analysis.

• Measures sheet resistance for wafer, thin-film, solar and related industries; supports 200 mm wafers or 140 × 140 mm film/glass samples
• Displays sheet-resistance units: Ω, Ω/□, Ω·cm and S
• Operates independently or under computer-software control
• Versatile analysis software displays 2D contour maps and 3D graphics
• Uses a high-precision JANDEL probe


Measurement Range

1 mΩ/□~2 MΩ/□

Operating Method

Simply place the sample on the test platform and press the measurement button. The range adjusts automatically and displays the correct reading, including the decimal point and multiplier.

JANDEL Four-Point Probe

The probe uses a quick-fit connector/adapter designed by JANDEL. No special tools or alignment fixture are required; installation takes only minutes. A JANDEL probe is included as standard equipment.

Measurement Display

Measurement data is displayed directly on the instrument panel.

Measurement Speed

Approximately 2±1 seconds per point

Internal Component Accuracy

±0.5% (high-precision resistor)

Maintenance and Service

Advanced microprocessor technology provides reliable, trouble-free operation. All electronic components are installed on easily replaceable printed circuit boards.

 

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