AiT Four-Point Probe Resistance Measurement System
How to Choose a Four-Point Probe System: Sample Size, Sheet Resistance Range, and Mapping Needs
For wafer measurements, compare 12-inch and 8-inch platforms; for glass, conductive films, and panel samples, compare film platforms; for solar cells, consider a dedicated model; for single-point R&D tests, compare benchtop and manual systems. First confirm that the sample can contact the probes, then compare platform size, probe configuration, and data analysis.
Four-point probes are commonly used to measure sheet resistance (Ω/□). Calculating resistivity (Ω·cm) also requires sample thickness, geometry, and applicable correction factors. For a multi-point distribution map, confirm point setup, platform movement, and software configuration.
Compare models by sample and measurement workflow
Compare compatible samples, measurement dimensions, operation, and Mapping capability. Select a model to view its product details.
| Model | Compatible sample | Measurement size (mm) | Operation | Mapping |
|---|---|---|---|---|
| CMT-SR5000 | Wafer | Ø300（12-inch） | Semi-automatic | ✓ |
| CMT-SR2000N | Wafer | Ø200（8-inch） | Semi-automatic | ✓ |
| CMT-SR3000 series | Glass, conductive films ITO/TCO, panels | 500 × 500（S） 620 × 720（M） 1100 × 1300（L） | Semi-automatic | ✓ |
| CMT-SR2000N-PV | Solar cell | 156 × 156 | Semi-automatic | ✓ |
| CMT-SR1000N | Wafers and small samples | Ø100（4-inch） | Semi-automatic | ✓ |
| CMT-100MP | Conductive films, glass R&D materials | 220 × 220 | Manual | — |
| CMT-100S | Wafer, conductive films R&D materials | 190 × 190 | Manual | — |
Ø indicates wafer diameter; length × width indicates the measurement size for square samples or platforms. ✓ indicates Mapping analysis is available.
Distinguish sheet resistance, resistivity, and thickness conversion
Sheet resistance is commonly expressed in Ω/□ and compares the electrical properties of conductive layers. Resistivity in Ω·cm is calculated from the material and sample geometry. Estimating film thickness from sheet resistance requires known material resistivity and valid conversion conditions; multilayer conductive structures or conductive substrates cannot be treated as a single film.
Mapping displays value distribution across measurement points. Confirm which movements are automated, which require manual sample positioning, and whether the software can provide the required charts and reports.
Please provide these details before requesting a quotation
- Sample material, length and width or wafer diameter, thickness, and conductive-layer structure.
- Estimated sheet-resistance range and whether you need sheet resistance, resistivity, or estimated thickness.
- Whether contact measurement is possible, plus probe spacing, contact force, and test-point restrictions.
- Single-point or multi-point measurement, samples per batch, and chart, report, and data-export requirements.
Fulcrum Technology can discuss model selection, probe configuration, equipment demonstrations, and after-sales support. Confirm supplied configuration, demonstration models, stock, lead time, and repair service for the specific model and requirements.
The AiT CMT-SR5000, supplied by Fulcrum Technology, is a four-point probe system designed for sheet-resistance and resistivity measurements on 12-inch wafers. Paired with a high-stability probe from UK-based Jandel, it supports electrical testing of semiconductor wafers and applications involving diffusion, doping, thin-film deposition, conductive films, solar cells, materials research, and process quality control. The system can be evaluated according to wafer size, measurement locations, expected sheet-resistance and resistivity ranges, mapping requirements, data analysis needs, and the existing QC workflow. Its versatile mapping software helps review measurement distribution and uniformity across the wafer; thickness may also be assessed from electrical measurements when the required material parameters and conversion conditions are known. Confirm the suitable probe and platform configuration, measurable ranges, and data-output requirements against the actual sample and inspection purpose.
The AiT CMT-SR2000N-PV, supplied by Fulcrum Technology, is a semi-automatic four-point probe measurement system for Solar PV cells, including 156 × 156 mm samples. Combined with a high-stability Jandel probe from the UK, it supports sheet-resistance (Ω/□) and resistivity (Ω·cm) measurements for solar cells and related materials. Its versatile mapping software offers multiple graphical views and analysis tools to help assess measurement results, distribution, and uniformity across sample locations for process evaluation and quality management. Configuration can be reviewed according to sample size, measurement points, expected electrical ranges, analysis requirements, and the existing QC workflow. Confirm the applicable measurement range, point layout, probe configuration, and data-output requirements using the actual sample and inspection purpose.
The AiT CMT-SR3000 series is a semi-automatic four-point probe measurement system designed for conductive thin films used in FPD, glass, touch panel and materials industries. It can measure surface resistance, sheet resistance and resistivity of glass, thin films, ITO, TCO, conductive coatings and related materials. The system can be configured with a JANDEL four-point probe head and mapping analysis software to display measurement distributions as 2D contour maps or 3D plots, supporting R&D, process monitoring and quality control. Confirm the appropriate configuration according to sample dimensions, material structure, resistance range, measurement locations, platform size and data-analysis requirements.
The AiT CMT-SR1000N is a four-point probe measurement system for 4-inch wafers. It can be configured with a high-stability JANDEL probe from the UK to support precise measurement of surface resistance (Ω/□) and volume resistivity (Ω·cm). Multifunctional mapping software helps analyze resistance uniformity, and thickness data can also be calculated from resistance measurements to support further sample analysis.
The AiT CMT-SR2000N semi-automatic 8-inch wafer measurement system pairs with a high-stability UK JANDEL probe to provide precise four-point measurements of sheet resistance (Ω/□) and volume resistivity (Ω·cm). Its versatile Mapping software analyzes resistance uniformity and calculates thickness from resistance data, supporting efficient measurement and analysis.
The CMT-100MP is a handheld four-point probe instrument for rapid measurement of surface resistance, sheet resistance, or resistivity in films, glass, conductive materials, ITO/TCO, solar materials, wafer pieces, coated samples, and R&D materials. Compared with benchtop four-point probe systems, it is suited to quick on-site checks, preliminary sample screening, incoming inspection, and measurements on large samples or local areas that are difficult to place on a platform. Confirm suitability against sample dimensions and surface condition, resistance range, probe contact conditions, and inspection objectives.
AiT CMT-100S is an entry-level manual four-point probe measurement system distributed by Zhidian. It uses a Signatone probe to accurately measure surface resistance (ohm/sq) and volume resistivity (ohm·cm). The integrated controller and measurement stage save space, while the internal modular slot design simplifies maintenance. This standard four-point probe system offers high accuracy, stability, and excellent value.