Semiconductor Electrical Measurement | Dielectric, Resistivity & Materials Analysis
Semiconductor Electrical Measurement | Dielectric, Resistivity & Materials Analysis
Fulcrum Technology provides electrical measurement systems for semiconductor and materials research, covering dielectric constant, dielectric loss, impedance, resistivity, conductivity, gas-sensing resistance, ferroelectricity and pyroelectricity.
These systems support research on semiconductor materials, ceramics, dielectrics, thin films, piezoelectric materials and functional materials. Select a suitable configuration according to the sample, test temperature and measurement parameters.
Ask about electrical measurement systemsChoose a system by measurement parameter
Dielectric temperature spectroscopy and impedance analysis
Analyze dielectric constant, dielectric loss, impedance, and their changes with frequency and temperature. Suitable for research on ceramics, thin films, dielectrics and piezoelectric materials.
Related series: PAR-HTDS-500, HDMS-1000, VDMS-2000
Resistivity and conductivity measurement
Evaluate resistivity measurement systems for high-temperature conductive or insulating materials, based on material conductivity, sample dimensions and test temperature.
Four-point probe measurement
Use a four-point probe to evaluate sheet resistance and resistivity for compatible materials. Actual measurements should account for sample dimensions, thickness, probe configuration and correction factors.
Gas-sensing resistance analysis
Evaluate changes in material resistance under specified gases, temperatures and test conditions for research on gas-sensing materials and related components.
Ferroelectric property measurement
Depending on the system configuration, evaluate parameters such as polarization hysteresis loops, fatigue characteristics and leakage current in ferroelectric films and related materials.
Pyroelectric and polarization analysis
Evaluate thermally stimulated current, polarization and depolarization measurements as needed, and select temperature-control and measurement configurations according to material properties.
How to select an electrical measurement system
Confirm the measurement parameters
Identify whether you need dielectric constant, dielectric loss, impedance, sheet resistance, volume resistivity or ferroelectric property measurements.
Confirm the sample format
Provide the material, dimensions, thickness, whether the sample is a thin film or bulk material, and whether it has electrodes or a special structure.
Confirm the test environment
Specify room, high or low temperature, vacuum or a controlled gas environment, along with the required temperature and frequency ranges.
Confirm data analysis needs
Indicate whether you need temperature or frequency sweeps, automatic recording, curve analysis or data export.
Information to prepare before requesting a quotation
Share the sample material, dimensions and thickness; electrical parameters of interest; test temperature; frequency range; test environment; and data analysis requirements.
Measurement principles and suitable conditions vary by system. Confirm the specifications, measurement range, sample fixtures and optional functions for the selected model.
Contact Fulcrum Technology for selection advice