AiT CMT-SR3000 Series Semi-Automatic Conductive Thin Film Four-Point Probe Measurement System
The AiT CMT-SR3000 series is a semi-automatic four-point probe measurement system designed for conductive thin films used in FPD, glass, touch panel and materials industries. It can measure surface resistance, sheet resistance and resistivity of glass, thin films, ITO, TCO, conductive coatings and related materials. The system can be configured with a JANDEL four-point probe head and mapping analysis software to display measurement distributions as 2D contour maps or 3D plots, supporting R&D, process monitoring and quality control. Confirm the appropriate configuration according to sample dimensions, material structure, resistance range, measurement locations, platform size and data-analysis requirements.
- Surface resistance measurement for glass, films and similar products.
- Measurement units: ohm, ohm/sq, ohm·cm and S.
- Operates independently or with computer software control.
- Analysis software presents results in 2D contour maps and 3D plots.
- Equipped with a high-precision JANDEL probe.
Measurement range: 1 mΩ/sq to 2 MΩ/sq
Operating method: Place the sample on the platform and operate the system through the software.
JANDEL four-point probe head with quick-connect fittings and converter; no special tools or alignment are required. Installation takes only a few minutes. JANDEL probe included.
Measurement results are displayed on the LCD.
Measurement speed: approximately 3±1 seconds per point.
Accuracy: ±0.5% using a high-precision resistor.
Microprocessor-based design for reliable operation; PCBs are replaceable for maintenance.
Platform sizes: 500 × 500 mm (S), 620 × 720 mm (M), 1100 × 1300 mm (L), or custom size (C).